Abstract: In order to enhance the robustness of SoC against single event effect (SEE), we focused on the improving of reliability for bus on chip. We built models for error rate of bus and equations of bus reliability. Concerning three situations, we restricted the value of parameters and thus, discussed the optimization of the parameters. For each of the situation, we give the optimized value of parameters that brings us the highest reliability for bus on chip.

Key words: single event effect, reliability, modeling, parameter optimization